Studies on Aphid Resistance and Some Quantitative Characters of Some Selected Lines of Indian Mustard (Brassica juncea L. Czern and Coss)

Abstract

Eight lines of Indian mustard (Brassica juncea L. Czern and Coss) were evaluated in 2007-08 under unprotected condition with four replications in a randomized block design at the instructional farm of Bidhan Chandra Krishi Viswavidyalaya, Mohan­pur. The objectives of the studies were to identify aphid resistant lines and to study the association of yield and yield attributing characters. The lines showed significant differences with respect to most of the traits excepting plant height, length of main raceme and aphid score at 86 days after sowing (DAS). The mean performances of aphid resistant lines indicated aphid infestation did not cause significant reduction in seed yield as compared to resistant check T-6342. Two lines AR-22 and AR-30 showed higher values of plant height, length of main raceme and aphid score at 86 DAS than the susceptible check Varuna. Length of main raceme, number of branches plant-1, number of siliquae on branches, number of seeds siliqua-1 and number of filled siliquae on top 10 cm were the main determinants contributing to seed yield under aphid infestation.